Author: Saa Hernandez, A.     [Saá Hernández, Á.]
Paper Title Page
THB02 Experimental Results of Diagnostics Response for Longitudinal Phase Space 657
  • F. Frei, V.R. Arsov, H. Brands, R. Ischebeck, B. Kalantari, R. Kalt, B. Keil, W. Koprek, F. Löhl, G.L. Orlandi, Á. Saá Hernández, T. Schilcher, V. Schlott
    PSI, Villigen PSI, Switzerland
  At SwissFEL, electron bunches will be accelerated, shaped, and longitudinally compressed by different radio frequency (RF) structures (S-, C-, and X-band) in combination with magnetic chicanes. In order to meet the envisaged performance, it is planned to regulate the different RF parameters based on the signals from numerous electron beam diagnostics. Here we will present experimental results of the diagnostics response on RF phase and field amplitude variations that were obtained at the SwissFEL Injector Test Facility.  
slides icon Slides THB02 [6.110 MB]  
THP097 Longitudinal Response Matrix Simulations for the SwissFEL Injector Test Facility 964
  • Á. Saá Hernández, F. Frei, R. Ischebeck
    PSI, Villigen PSI, Switzerland
  • B. Beutner
    DESY, Hamburg, Germany
  The Singular Value Decomposition (SVD) method has been applied to the SwissFEL Injector Test Facility to identify and better expose the various relationships among the possible jitter sources affecting the longitudinal phase space distribution and the longitudinal diagnostic elements that measure them. To this end, several longitudinal tracking simulations have been run using the Litrack code. In these simulations the RF and laser jitter sources are varied one-by-one within a range spanning twice their expected stability. The particle distributions have been dumped at the diagnostic locations and the measured quantities analyzed. A matrix has been built by linearly fitting the response of each measured quantity to each jitter source. This response matrix is normalized to the jitter source stability and the instrumentation accuracy, and it is inverted and analyzed using SVD. From the eigenvalues and eigenvectors the sensitivity of the diagnostics to the jitters can be evaluated and their specifications and locations optimized.