Author: Ivanisenko, Ye.
Paper Title Page
THP082 Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF 922
  • Ye. Ivanisenko, V. Schlott
    PSI, Villigen PSI, Switzerland
  • P. Peier
    DESY, Hamburg, Germany
  Funding: The research leading to these results has received funding from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement n.°290605 (PSI-FELLOW/COFUND)
The SwissFEL Injector Test Facility (SITF) is an electron linear accelerator with a single bunch compression stage at Paul Scherrer Institute (PSI) in Switzerland. Electro-optic monitors (EOMs) are available for bunch temporal profile measurements before and after the bunch compressor. The profile reconstruction is based upon spectral decoding technique. This diagnostic method is non-invasive, compact and cost-effective. It does not have high resolution and wide dynamic range of an RF transverse deflecting structure (TDS), but it is free of transverse beam size influence, what makes it a perfect tool for fast compression tuning. We present results of EOM and TDS measurements with down to 150 fs long bunches after the compression stage at SITF.