Author: Catani, L.
Paper Title Page
WEOB02 Optical Diffraction Radiation Interference as a Non-intercepting Emittance Measurement for High Brightness and High Repetition Rate Electron Beam 353
 
  • A. Cianchi, L. Catani, E. Chiadroni
    INFN-Roma II, Roma, Italy
  • V. Balandin, N. Golubeva, K. Honkavaara, G. Kube
    DESY, Hamburg, Germany
  • M. Castellano
    INFN/LNF, Frascati (Roma), Italy
  • M. Migliorati
    URLS, Rome, Italy
 
  Conventional intercepting transverse electron beam diagnostics, as the one based on Optical Transition Radiation (OTR), cannot tolerate high power beams without significant mechanical damages of the diagnostics device. Optical Diffraction Radiation (ODR), instead, is an excellent candidate for the measurements of the transverse phase space parameters in a non-intercepting way. One of the main limitation of this method is the low signal to noise ratio, mainly due to the synchrotron radiation background. This problem can be overcome by using ODRI (ODR Interference). In this case the beam goes through slits opened in two metallic foils placed at a distance shorter than the radiation formation zone. Due to the shielding effect of the first screen a nearly background-free ODR interference pattern can be measured allowing the determination of the beam size and the angular divergence. We report here the result of the first measurements of the beam emittance using ODRI carried out at FLASH (DESY). Our result demonstrate the unique potential of this technique suitable to be used as not intercepting diagnostic in every machine with high brightness and high repetition rate electron beam.  
slides icon Slides WEOB02 [1.928 MB]