Author: Bromberger, H.
Paper Title Page
TUOB03
Complete Ultrafast X-ray Pulse Characterization at FELs  
 
  • A.L. Cavalieri, H. Bromberger, I. Grguras, S. Huber
    CFEL, Hamburg, Germany
  • C. Behrens, S. Düsterer, H. Schlarb
    DESY, Hamburg, Germany
  • C. Bostedt, J.D. Bozek, R.N. Coffee, Y.T. Ding, J.B. Hastings, M.C. Hoffmann, S. Schorb
    SLAC, Menlo Park, California, USA
  • J.T. Costello
    DCU, Dublin, Republic of Ireland
  • L.F. DiMauro
    Ohio State University, USA
  • G. Doumy
    ANL, Argonne, USA
  • W. Helml, R. Kienberger, A.R. Maier, W. Schweinberger
    MPQ, Garching, Munich, Germany
  • N.M. Kabachnik, T. Mazza, M. Meyer, T. Tschentscher
    XFEL. EU, Hamburg, Germany
  • A.K. Kazansky
    UPV-EHU, Leioa, Spain
 
  The ability to fully characterize X-ray pulses from free electron-lasers will underpin their exploitation in experiments ranging from single-molecule imaging to extreme timescale X-ray science. This issue is especially acute when confronted with the characteristics of current generation FELs operating on the principle of SASE, as most parameters fluctuate strongly from pulse to pulse. Here, we have extended the techniques of attosecond metrology with the use of single-cycle terahertz (THz) pulses, allowing for simultaneous, in-line, single-shot measurement of both the arrival time and temporal profile of FEL pulses on an absolute scale. The technique is non-invasive and could be incorporated in pump-probe experiments, eventually leading to characterization before and after interaction with most sample environments. Optical-laser-driven THz streaking measurements, revealing X-ray pulse structure shorter than 50 fs FWHM in the soft X-ray regime at FLASH and in the ~ keV range at LCLS will be discussed. With clear potential for improvement in resolution to the sub-10 fs regime, this method will ultimately allow for characterization of the shortest predicted few-femtosecond FEL pulses.  
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