FEL2011 - List of Authors (Wang, M.-H.)

Paper	Title	Page
WEPB14	Ultra-short Electron Bunch and X-ray Temporal Diagnostics with an X-band Transverse Deflector	405
	C. Behrens DESY, Hamburg, Germany Y.T. Ding, P. Emma, J.C. Frisch, Z. Huang, P. Krejcik, H. Loos, M.-H. Wang SLAC, Menlo Park, California, USA
	The measurement of ultra-short electron bunches on the femtosecond time scale constitutes a very challenging problem. In X-ray free-electron laser facilities such as the Linac Coherent Light Source (LCLS), generation of sub-ten femtosecond X-ray pulses is possible, and some efforts have been put into both ultra-short electron and X-ray beam diagnostics. Here we propose a single-shot method using a transverse deflector (X-band) after the undulator to reconstruct both the electron bunch and X-ray temporal profiles. Simulation studies show that about 1 fs (rms) time resolution may be achievable in the LCLS and is applicable to a wide range of FEL wavelengths and pulse lengths. The jitter, resolution and other related issues will be discussed.

Paper

Title

Page

Ultra-short Electron Bunch and X-ray Temporal Diagnostics with an X-band Transverse Deflector

405

C. Behrens
DESY, Hamburg, Germany
Y.T. Ding, P. Emma, J.C. Frisch, Z. Huang, P. Krejcik, H. Loos, M.-H. Wang
SLAC, Menlo Park, California, USA

The measurement of ultra-short electron bunches on the femtosecond time scale constitutes a very challenging problem. In X-ray free-electron laser facilities such as the Linac Coherent Light Source (LCLS), generation of sub-ten femtosecond X-ray pulses is possible, and some efforts have been put into both ultra-short electron and X-ray beam diagnostics. Here we propose a single-shot method using a transverse deflector (X-band) after the undulator to reconstruct both the electron bunch and X-ray temporal profiles. Simulation studies show that about 1 fs (rms) time resolution may be achievable in the LCLS and is applicable to a wide range of FEL wavelengths and pulse lengths. The jitter, resolution and other related issues will be discussed.