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WEPB22 |
An Optical Streaking Method for Measuring Femtosecond Electron Bunches |
431 |
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- Y.T. Ding, K.L.F. Bane, Z. Huang
SLAC, Menlo Park, California, USA
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The measurement of the ultra-short electron bunch on the femotosecond time scale constitutes a very challenging problem. In the X-ray free electron laser facilities such as the Linac Coherent Light Source (LCLS), generation of a sub-ten femtoseconds electron beam at low charge operation mode is possible, based on indirect measurements and computer simulations. Direct measurements are not available due to the resolution limit of the present diagnostics. We propose a new method based on the energy modulation of the ultra-short electron bunch by interacting with an optical laser in a short wiggler. Compared with a laser-based transverse deflector, which requires the laser wavelength much longer than the electron bunch length, here we propose a scheme to use a laser with its wavelength shorter than the electron bunch length, where the slope on the laser intensity envelope has been used to help distinguish the different periods. The calibration is simple and it is possible to reconstruct the bunch longitudinal profile from a single shot measurement.
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