Paper | Title | Page |
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WEPB20 | Novel Nondestructive Shot-by-Shot Monitor to Measure 3D Bunch Charge Distribution With a Femtosecond EO-Sampling | 445 |
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We developed a single-shot and non-destructive 3D bunch charge distribution (BCD) monitor based on Electro-Optical (EO) sampling with a manner of spectral decoding for XFEL/SPring-8. For the transverse detection, eight EO-crystals (Pockels effect) surround the beam axis azimuthally, and a linear-chirped probe laser pulse with a hollow shape passes through the EO-crystal. We plan to use an amorphous material which has only an even-order field dependence (Kerr effect) in donut shape without assembling eight conventional EO-crystals. The polarization axis of the probe laser should be radially distributed as well as the Coulomb field of the electron bunches. Since the signal intensity encoded at each crystal depends on the strength of the Coulomb field at each point, we can detect the transverse BCD. In the longitudinal detection, we use a prove laser with a broadband square spectrum (> 400 nm @ 800 nm) so that the temporal resolution is < 30 fs, if the pulse width of probe laser is 500 fs. In order to achieve 30-fs temporal resolution, we use an organic EO material, DAST crystal, which is transparent up to 30 THz. We report the first experimental results of our 3D-BCD monitor. |