• A.H. Lumpkin, H.T. Edwards, A.S. Johnson, J. Ruan, J.K. Santucci, Y.-E. Sun, R. Thurman-Keup
  Fermilab, Batavia

It is recognized that beam manipulations such as a flat beam transformation followed by an emittance exchange (EEX) could support a high gain free-electron laser (FEL) push for shorter wavelengths. An ongoing program on demonstrating the exchange of transverse horizontal and longitudinal emittances at the Fermilab A0 photoinjector (A0PI) has benefited recently from the upgrade of several of the key diagnostics stations. The use of an array of 50-micron wide slits to sample the phase spaces to measure divergences of less than 100 microradians resulted in 20 times smaller images with positions distributed over several mm. Improvements in the screen resolution term and reduction of the system depth-of-focus impact by using YAG:Ce single crystals normal to the beam direction will be described. On the longitudinal side, the requirements to measure small energy spreads (<10 keV) in the spectrometer and bunch lengths less than 500 fs dictated specifications. Upgrades to the Hamamatsu C5680 streak camera and the addition of the Martin-Puplett interferometer addressed the short bunch lengths. An example of the EEX tables will be presented.