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Mueller, F.     [Müller, F.]

Paper Title Page
WEPA09 A Compact Electro Optical Bunch Length Monitoring System - First Results at PSI 374
 
  • F. Müller, P. Peier, V. Schlott
    PSI, Villigen
  • B. Steffen
    DESY, Hamburg
  
 

Electro Optical (EO) sampling is a promising non-destructive method for measuring ultra short (sub picosecond) electron bunches. A prototype of a compact EO bunch length monitor system for the future SwissFEL facility was designed and built at PSI. Its core components are an optical setup including the electro optically active crystal and an Ytterbium fiber laser system which emits broadband pulses at 1050nm. The new monitoring system is described in detail and first experimental results from the SLS injector are presented.

  
WEPA10 Electro Optical Measurement of Coherent Synchrotron Radiation for Picosecond Electron Bunches With Few pC 378
 
  • B. Steffen
    DESY, Hamburg
  • F. Müller, P. Peier, V. Schlott
    PSI, Villigen
  
 

Electro Optical (EO) sampling is a promising non-destructive method for measuring ultra short (sub-ps) electron bunches. The FEMTO slicing experiment at the Swiss Light Source modulates about 3 pC of the 5 nC electron bunch longitudinally. The coherent synchrotron radiation (CSR) emitted by this substructure was measured in a single shot EO technique in gallium phosphide (GaP) using pulses from an Yb fiber laser. The arrival time jitter and the broadening of this ps long structure over several turns of the synchrotron could be measured with sub-ps resolution.