Author: Schubert, S.G.
Paper Title Page
TUICLH1030 Improving the Smoothness of Multialkali Antimonide Photocathodes: An In-Situ X-Ray Reflectivity Study 27
 
  • Z. Ding, E.M. Muller
    SBU, Stony Brook, New York, USA
  • K. Attenkofer, M. Gaowei, J. Sinsheimer, J. Smedley, J. Walsh
    BNL, Upton, Long Island, New York, USA
  • H. Bhandari
    Radiation Monitoring Devices, Watertown, USA
  • H.J. Frisch
    Enrico Fermi Institute, University of Chicago, Chicago, Illinois, USA
  • J. Kühn
    HZB, Berlin, Germany
  • H.A. Padmore, S.G. Schubert, J.J. Wong
    LBNL, Berkeley, California, USA
  • J. Xie
    ANL, Argonne, Illinois, USA
 
  Multialkali antimonide photocathodes have been shown to be excellent electron sources for a wide range of applications because of high quantum efficiency, low emittance, good lifetime, and fast response. In recent years, synchrotron X-ray methods have been used to study the growth mechanism of K2CsSb photocathodes. The traditional sequential growth of CsK2Sb has been shown to result in rough surface, which will have an adverse impact on the emittance of the electron beam. However, co-evaporation of alkali metals on the evaporated Sb layer and sputter deposition may offer a route to solving the roughness problem. Recent studies on K2CsSb grown by these methods are presented and surface roughness is determined by X-ray reflectivity (XRR) and results are compared.  
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