DIPAC2011 - List of Keywords (ion-source)

Paper	Title	Other Keywords	Page
MOPD88	Electron Beam Ion Sources, Ion Optical Elements and Beam Diagnostics for Particle Accelerators	ion, emittance, electron, injection	254
	F. Ullmann, V.P. Ovsyannikov, M. Schmidt DREEBIT GmbH, Dresden, Germany G. Zschornack Technische Universität Dresden, Institut für Angewandte Physik, Dresden, Germany
	Electron Beam Ion Sources (EBISs) provide highly charged ions (HCIs) for a variety of investigations and applications, amongst others as injection source for particle accelerators. EBISs feature a lot of advantages which qualify them for accelerator injection, and which partly compensate their comparatively low number of particles. DREEBIT GmbH provides a family of compact EBISs based on permanent magnets. A more sophisticated version is based on cryogen-free superconducting magnets providing a higher ion output. Its compact design makes them transportable, low in operational costs, and guarantee easy handling. We present latest improvements and measurements proving the feasibility of producing beams of HCIs with convenient beam properties such as low transversal and longitudinal emittance. In addition we present a variety of ion optical elements and ion beam diagnostics. The DREEBIT Wien filter allows for the charge mass separation. The DREEBIT Pepper-pot Emittance Meter allows for emittance measurements of beams of a wide range of particle intensity. Other beam diagnostics are provided, such as Beam Imaging System, Retarding Field Analyzer and different kinds of Faraday cups.

TUOC01	Highlights from the 2010 Beam Instrumentation Workshop	instrumentation, ion, ECR, linac	297
	J.D. Gilpatrick LANL, Los Alamos, New Mexico, USA
	Funding: Work supported by the U.S. Department of Energy. The 14th Beam Instrumentation Workshop (BIW10) was hosted by the Los Alamos National Laboratory and was held in the La Fonda Hotel in downtown Santa Fe, NM, USA from May 3 – 6, 2010. At BIW10, there were a record amount of participants including 177 registered attendees, 92 poster presentations, and 22 companies represented. The oral presentations included 3 tutorials, 8 invited, 10 contributed, a Faraday Cup Award, 2 Vendor Technical, and 1 Special. This oral presentation provides an overview of beam instrumentation areas of interest, which were discussed during the workshop. From a selection of the BIW10 presented papers, a number of technical highlights will also be described. Finally, this oral presentation will briefly discuss the BIW10 Thursday afternoon tour that took place at the Los Alamos Neutron Science Center.
	Slides TUOC01 [3.110 MB]

TUPD06	Beam Diagnostic Overview of the SPIRAL2 RNB Section	ion, controls, electron, target	314
	C. Jamet, T.A. André, E. Guéroult, B. Jacquot, N. Renoux, A. Savalle, T. Signoret, F. Varenne, J.L. Vignet GANIL, Caen, France J.-M. Fontbonne LPC, Caen, France
	An extension to the existing GANIL facility in Caen, France is under construction. The new SPIRAL 2 construction will be realized in two phases, for the first phase the construction started in January 2011 and will consists of the accelerator buildings with two experimental facilities S3 and Neutrons for science (NFS). The second phase is the so called production building where radioactive ions are produced through the ISOL (Isotope Separation On Line) method. The produced radioactive ion beams (RIBs) will be extracted and accelerated up to 60keV from the ion sources, after beam purification the beam will be driven in the secondary beam lines either to a new experimental facility DESIR (Decay, excitation and storage of radioactive ions) constructed during the second phase of the new installation or the RIBs will be charge breed to form multi-charged ions that will be driven to the existing GANIL facility and post accelerated in the CIME cyclotron. This overview article gives a description of the secondary beam lines, the foreseen beam diagnostics which will allow tuning and controlling the radioactive ion beams in the secondary beam lines constructed in the SPIRAL2 Phase 2.

Paper

Title

Other Keywords

Page

MOPD88

Electron Beam Ion Sources, Ion Optical Elements and Beam Diagnostics for Particle Accelerators

ion, emittance, electron, injection

254

F. Ullmann, V.P. Ovsyannikov, M. Schmidt
DREEBIT GmbH, Dresden, Germany
G. Zschornack
Technische Universität Dresden, Institut für Angewandte Physik, Dresden, Germany

Electron Beam Ion Sources (EBISs) provide highly charged ions (HCIs) for a variety of investigations and applications, amongst others as injection source for particle accelerators. EBISs feature a lot of advantages which qualify them for accelerator injection, and which partly compensate their comparatively low number of particles. DREEBIT GmbH provides a family of compact EBISs based on permanent magnets. A more sophisticated version is based on cryogen-free superconducting magnets providing a higher ion output. Its compact design makes them transportable, low in operational costs, and guarantee easy handling. We present latest improvements and measurements proving the feasibility of producing beams of HCIs with convenient beam properties such as low transversal and longitudinal emittance. In addition we present a variety of ion optical elements and ion beam diagnostics. The DREEBIT Wien filter allows for the charge mass separation. The DREEBIT Pepper-pot Emittance Meter allows for emittance measurements of beams of a wide range of particle intensity. Other beam diagnostics are provided, such as Beam Imaging System, Retarding Field Analyzer and different kinds of Faraday cups.

TUOC01

Highlights from the 2010 Beam Instrumentation Workshop

instrumentation, ion, ECR, linac

297

J.D. Gilpatrick
LANL, Los Alamos, New Mexico, USA

Funding: Work supported by the U.S. Department of Energy.
The 14th Beam Instrumentation Workshop (BIW10) was hosted by the Los Alamos National Laboratory and was held in the La Fonda Hotel in downtown Santa Fe, NM, USA from May 3 – 6, 2010. At BIW10, there were a record amount of participants including 177 registered attendees, 92 poster presentations, and 22 companies represented. The oral presentations included 3 tutorials, 8 invited, 10 contributed, a Faraday Cup Award, 2 Vendor Technical, and 1 Special. This oral presentation provides an overview of beam instrumentation areas of interest, which were discussed during the workshop. From a selection of the BIW10 presented papers, a number of technical highlights will also be described. Finally, this oral presentation will briefly discuss the BIW10 Thursday afternoon tour that took place at the Los Alamos Neutron Science Center.

Slides TUOC01 [3.110 MB]

TUPD06

Beam Diagnostic Overview of the SPIRAL2 RNB Section

ion, controls, electron, target

314

C. Jamet, T.A. André, E. Guéroult, B. Jacquot, N. Renoux, A. Savalle, T. Signoret, F. Varenne, J.L. Vignet
GANIL, Caen, France
J.-M. Fontbonne
LPC, Caen, France

An extension to the existing GANIL facility in Caen, France is under construction. The new SPIRAL 2 construction will be realized in two phases, for the first phase the construction started in January 2011 and will consists of the accelerator buildings with two experimental facilities S3 and Neutrons for science (NFS). The second phase is the so called production building where radioactive ions are produced through the ISOL (Isotope Separation On Line) method. The produced radioactive ion beams (RIBs) will be extracted and accelerated up to 60keV from the ion sources, after beam purification the beam will be driven in the secondary beam lines either to a new experimental facility DESIR (Decay, excitation and storage of radioactive ions) constructed during the second phase of the new installation or the RIBs will be charge breed to form multi-charged ions that will be driven to the existing GANIL facility and post accelerated in the CIME cyclotron. This overview article gives a description of the secondary beam lines, the foreseen beam diagnostics which will allow tuning and controlling the radioactive ion beams in the secondary beam lines constructed in the SPIRAL2 Phase 2.