Cyclotrons2013 - List of Authors (Kremers, H.R.)

Paper	Title	Page
WEPPT009	Transverse Phase-Space Distributions of Low Energy Ion Beams Extracted from an ECR Ion Source	341
	S. Saminathan TRIUMF, Canada's National Laboratory for Particle and Nuclear Physics, Vancouver, Canada J.P.M. Beijers, S. Brandenburg, H.R. Kremers, V. Mironov KVI, Groningen, The Netherlands
	Transverse phase-space distributions of low-energy ion beams extracted from ECR ion sources often show higher-order effects caused by ion-optical aberrations. Understanding these effects is mandatory to keep emittance growth and the resulting beam losses in low-energy beam transport lines under control. We present the results of an experimental and theoretical study of beam extraction and transport in the AGOR injection line at KVI. Particle tracking simulations have been performed of a multi-component neon ion beam extracted from an ECR ion source to calculate 4D phase-space distributions at various positions along the beamline. The simulations compare well with beam profile and emittance measurements.

Paper

Title

Page

Transverse Phase-Space Distributions of Low Energy Ion Beams Extracted from an ECR Ion Source

341

S. Saminathan
TRIUMF, Canada's National Laboratory for Particle and Nuclear Physics, Vancouver, Canada
J.P.M. Beijers, S. Brandenburg, H.R. Kremers, V. Mironov
KVI, Groningen, The Netherlands

Transverse phase-space distributions of low-energy ion beams extracted from ECR ion sources often show higher-order effects caused by ion-optical aberrations. Understanding these effects is mandatory to keep emittance growth and the resulting beam losses in low-energy beam transport lines under control. We present the results of an experimental and theoretical study of beam extraction and transport in the AGOR injection line at KVI. Particle tracking simulations have been performed of a multi-component neon ion beam extracted from an ECR ion source to calculate 4D phase-space distributions at various positions along the beamline. The simulations compare well with beam profile and emittance measurements.