BIW2012 - List of Authors (Renuka, K.)

Paper	Title	Page
TUPG022	Transverse Beam Profile Monitoring using Scintillation Screens for High Energy Ion Beams	183
	K. Renuka, W. Ensinger TU Darmstadt, Darmstadt, Germany C.A. Andre, F. Becker, P. Forck, R. Haseitl, A. Reiter, B. Walasek-Höhne GSI, Darmstadt, Germany
	The systematic studies of transverse profile measurement were carried out with scintillation screens such as single crystals (CsI:Tl, YAG:Ce), powder screens (P43, P46), ceramics (Al2O3, Al2O3:Cr, Y and Mg doped ZrO2), Ce doped (0.3%) and undoped glasses (Herasil). Different ion beams like C, Ne, Ta, and U accelerated to energy of 300 MeV/u were extracted from the heavy ion synchrotron at GSI within 0.3 s for intensities from 10⁴ to 10⁹ particles per pulse. The image of each beam pulse was recorded by a CCD camera and individually evaluated. The recorded image profiles show a reproducible dependence on scintillation screen. A difference in image width up to 50% is noticed between CsI:Tl and Herasil. The detailed investigation shows that the powder screens P43 and P46, ceramics Al2O3 and Al2O3:Cr reproduce the beam width within a difference of ± 4% for all intensities. The light yield from the screens scales linearly over 5 orders of magnitude of particle intensity. The light yield per energy deposition by a single ion was calculated for different ion beams. This normalized light yield is a factor of 2 higher for Carbon ions compared to Uranium.

Paper

Title

Page

Transverse Beam Profile Monitoring using Scintillation Screens for High Energy Ion Beams

183

K. Renuka, W. Ensinger
TU Darmstadt, Darmstadt, Germany
C.A. Andre, F. Becker, P. Forck, R. Haseitl, A. Reiter, B. Walasek-Höhne
GSI, Darmstadt, Germany

The systematic studies of transverse profile measurement were carried out with scintillation screens such as single crystals (CsI:Tl, YAG:Ce), powder screens (P43, P46), ceramics (Al2O3, Al2O3:Cr, Y and Mg doped ZrO2), Ce doped (0.3%) and undoped glasses (Herasil). Different ion beams like C, Ne, Ta, and U accelerated to energy of 300 MeV/u were extracted from the heavy ion synchrotron at GSI within 0.3 s for intensities from 10⁴ to 10⁹ particles per pulse. The image of each beam pulse was recorded by a CCD camera and individually evaluated. The recorded image profiles show a reproducible dependence on scintillation screen. A difference in image width up to 50% is noticed between CsI:Tl and Herasil. The detailed investigation shows that the powder screens P43 and P46, ceramics Al2O3 and Al2O3:Cr reproduce the beam width within a difference of ± 4% for all intensities. The light yield from the screens scales linearly over 5 orders of magnitude of particle intensity. The light yield per energy deposition by a single ion was calculated for different ion beams. This normalized light yield is a factor of 2 higher for Carbon ions compared to Uranium.