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MOPG008 |
First-turn and Stored Beam Measurements with Single Bunch Filling Patterns Using Time-domain Processing at KEK-PF |
38 |
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- P. Leban, R. Hrovatin
I-Tech, Solkan, Slovenia
- T. Obina
KEK, Ibaraki, Japan
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High sensitivity and precision are two of the most important properties of the electron beam position processors. They are crucial when measuring the orbit of the first turn, of the first few turns and of a stored beam with a partial or a single bunch filling pattern. Up to now, the orbit of the first turn has been measured on the base of a raw ADC data processing. In parallel to the processing path that uses digital down conversion for calculating the turn-by-turn data, the new Libera Brilliance+ instrument also comprises an advanced solution. A large ADC buffer for raw data analysis (~8 ms) is combined with the new time-domain processing, that returns precise turn-by-turn data. The article presents this new functionality of the instrument and illustrates it with measurement results from the KEK Photon Factory storage ring.
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