Author: Hass, E.
Paper Title Page
THAP01 Fast Bunch Profile Monitoring with THz Spectroscopy of Coherent Radiation at FLASH 256
 
  • S. Wesch, C. Behrens, B. Schmidt
    DESY, Hamburg, Germany
  • E. Hass
    Uni HH, Hamburg, Germany
 
  We developed a fast bunch profile monitor based on wavelength-resolved THz detection. An in-vacuum spectrometer with four dispersive gratings and parallel readout of 120 individual wavelength bins provides detailed shot-to-shot information on the bunch shape. The device can be operated in short (5-44 um) and long range (45-435 um) mode to cover the entire longitudinal phase space for compressed bunches of the FLASH linac. Due to the large wavelength range, the electron bunch time profile can be reconstructed reliably in detail using Kramers-Kronig algorithm for the phase retrieval. Performance of the instrument and results compared to direct time domain (TDS) measurements will be presented for electron bunches down to a few 10th femtoseconds length.  
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