BIW2012 - List of Authors (Benatti, C.)

Paper	Title	Page
TUPG032	Scintillation Degradation of YAG: CE Under Low-Energy Ion Beam Bombardment	204
	L.Y. Lin FRIB, East Lansing, Michigan, USA C. Benatti, S.W. Krause, D. Leitner, G. Perdikakis NSCL, East Lansing, Michigan, USA
	Scintillators are widely used to reliably measure beam profiles and beam distribution. At the rare isotope ReAccelerator facility (ReA) of the National Superconducting Cyclotron Laboratory (NSCL) several scintillator viewers are used in the low energy transport section. In order to interpret the observed ion beam profiles, we have systematically studied the scintillator yields of CaF and YAG: Ce scintillators as a function of fluence at various low energies and with different bombarding ions. An exponential decay of the light yield as a function of time was observed. The dependence can be interpreted as ion induced defects of the crystal lattice during the bombardment. The color center defects induced by the radiation dose are likely to act as exciton trapping centers, leading to decrease the scintillator yield. We have studied the scintillator yield as a function of fluence in order to explore the influence of the beam energy and current on scintillation production and defect creation. The results can be interpreted by the Birks model to evaluate the half-dose brightness and the relative exciton capture probability. The results of the analysis will be presented.

Paper

Title

Page

Scintillation Degradation of YAG: CE Under Low-Energy Ion Beam Bombardment

204

L.Y. Lin
FRIB, East Lansing, Michigan, USA
C. Benatti, S.W. Krause, D. Leitner, G. Perdikakis
NSCL, East Lansing, Michigan, USA

Scintillators are widely used to reliably measure beam profiles and beam distribution. At the rare isotope ReAccelerator facility (ReA) of the National Superconducting Cyclotron Laboratory (NSCL) several scintillator viewers are used in the low energy transport section. In order to interpret the observed ion beam profiles, we have systematically studied the scintillator yields of CaF and YAG: Ce scintillators as a function of fluence at various low energies and with different bombarding ions. An exponential decay of the light yield as a function of time was observed. The dependence can be interpreted as ion induced defects of the crystal lattice during the bombardment. The color center defects induced by the radiation dose are likely to act as exciton trapping centers, leading to decrease the scintillator yield. We have studied the scintillator yield as a function of fluence in order to explore the influence of the beam energy and current on scintillation production and defect creation. The results can be interpreted by the Birks model to evaluate the half-dose brightness and the relative exciton capture probability. The results of the analysis will be presented.