Author: Tan, J.H.
Paper Title Page
TUPIK069 PXIe Embedded Control Station Based the Electric Breakdown Data Acquisition and RF Conditioning System for C-Band Accelerating Structures Using for Shanghai Soft X-Ray Free Electron Laser (SXFEL) 1855
 
  • Y. Li, W. Fang, J.Z. Gong, Q. Gu, J.J. Guo, L. Li, Z.B. Li, J.H. Tan, C.C. Xiao, J.Q. Zhang, M. Zhang, Z.T. Zhao
    SINAP, Shanghai, People's Republic of China
 
  Funding: Shanghai Institute of Applied Physics, The Chinese Academy of Science., National Development and Reform Commission, the People's Republic of China., National Natural Science Foundation of China.
Shanghai Soft X-Ray Free Electron Laser (SXFEL) adopts C-band structure to accelerate the electron to 1.5-GeV. Due to high gradient operation, the electric breakdown and structure conditioning problems need to be perfectly resolved. For this purpose, we develop an automatic conditioning control and electric breakdown data acquisition system. The control based on a PXI Express (PXIe) embedded frame and the LabView-FPGA technique. The prototype system design, the software programming and hardware test will be introduced. The experiment setup and test results for a low-level signal will be shown.
' Corresponding author: liyingmin@sinap.ac.cn
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-TUPIK069  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)  
 
THPIK068 High Power Test of SINAP X-Band Deflector at KEK 4251
 
  • J.H. Tan, W. Fang, Q. Gu, X.X. Huang, Z.B. Li, Z.T. Zhao
    SINAP, Shanghai, People's Republic of China
  • T. Higo
    KEK, Ibaraki, Japan
  • D.C. Tong
    TUB, Beijing, People's Republic of China
 
  A crucial RF structure used for bunch length measurement for Shanghai X-ray Free Electron Lasers (SXFEL) at the Shanghai Institute of Applied Physics (SINAP), Chinese Academy of Science [1]. The design, fabrication, measurement and tuning have been completed at SINAP [2], and the high power test was carried out at Nextef of KEK with international collaboration. This paper presents the RF conditioning process and test results.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-THPIK068  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)