IPAC2017 - List of Authors (Geng, R.L.)

Paper	Title	Page
MOPVA075	Development of High Sensitive X-Ray Mapping for SC Cavities	1040
	H. Tongu, H. Hokonohara, Y. Iwashita Kyoto ICR, Uji, Kyoto, Japan R.L. Geng, A.D. Palczewski JLab, Newport News, Virginia, USA H. Hayano, T. Kubo, T. Saeki, Y. Yamamoto KEK, Ibaraki, Japan H. Oikawa Utsunomiya University, Utsunomiya, Japan
	We developed an X-ray mapping system sX-map for superconducting cavities. The sensors are inserted under the stiffener rings between cavity cells, whose locations are close to the iris areas. The whole circuits are im-mersed in liquid He and the multiplexed signals reduces the number of cables to the room temperature region. sX-map has the advantages in its compact size, low cost and simple setup for nondestructive inspections. The sX-map system detected X-rays from field emissions in vertical RF tests of ILC 9-cell cavities at Jefferson Lab (JLab) and KEK. sX-map showed an excellent performance in the meas-urement test at JLab, it exhibited a high sensitivity com-pared with an the fixed diode rings colocated at irises and ion chamber located out side of the vertical test cryostat.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-MOPVA075
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Paper

Title

Page

Development of High Sensitive X-Ray Mapping for SC Cavities

1040

H. Tongu, H. Hokonohara, Y. Iwashita
Kyoto ICR, Uji, Kyoto, Japan
R.L. Geng, A.D. Palczewski
JLab, Newport News, Virginia, USA
H. Hayano, T. Kubo, T. Saeki, Y. Yamamoto
KEK, Ibaraki, Japan
H. Oikawa
Utsunomiya University, Utsunomiya, Japan

We developed an X-ray mapping system sX-map for superconducting cavities. The sensors are inserted under the stiffener rings between cavity cells, whose locations are close to the iris areas. The whole circuits are im-mersed in liquid He and the multiplexed signals reduces the number of cables to the room temperature region. sX-map has the advantages in its compact size, low cost and simple setup for nondestructive inspections. The sX-map system detected X-rays from field emissions in vertical RF tests of ILC 9-cell cavities at Jefferson Lab (JLab) and KEK. sX-map showed an excellent performance in the meas-urement test at JLab, it exhibited a high sensitivity com-pared with an the fixed diode rings colocated at irises and ion chamber located out side of the vertical test cryostat.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-MOPVA075

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)