FEL2014 - List of Authors (Yan, M.)

Paper	Title	Page
THP075	Design of TDS-based Multi-screen Electron Beam Diagnostics for the European XFEL	909
	J. Wychowaniak TUL-DMCS, Łódź, Poland C. Gerth, M. Yan DESY, Hamburg, Germany
	Dedicated longitudinal electron beam diagnostics is essential for successful operation of modern free-electron lasers. Demand for diagnostic data includes the longitudinal bunch profile, bunch length and slice emittance of the electron bunches. Experimental setups based on transverse deflecting structures (TDS) are excellent candidates for this purpose. At the Free-Electron Laser in Hamburg (FLASH), such a longitudinal bunch profile monitor utilizing a TDS, a fast kicker magnet and an off-axis imaging screen, has been put into operation. It enables the measurement of a single bunch out of a bunch train without affecting the remaining bunches. At the European X-ray Free-Electron Laser (XFEL) multiscreen stations in combination with TDS are planned to be installed. In order to allow for flexible measurements of longitudinal bunch profile and slice emittance, a configurable timing and trigger distribution to the fast kicker magnets and screen stations is required. In this paper, we discuss various operation patterns and the corresponding realization based on MTCA.4 technology.

THP088	Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility	941
	M. Yan, B. Beutner, C. Gerth DESY, Hamburg, Germany R. Ischebeck, E. Prat PSI, Villigen PSI, Switzerland
	High-brightness electron bunches with small transverse emittance are required to drive X-ray free-electron lasers (FELs). For the measurement of the transverse emittance, the quadrupole scan and multi-screen methods are the two most common procedures. By employing a transverse deflecting structure, the measurement of the slice emittance becomes feasible. The quadrupole scan is more flexible in freely choosing the data points during the scan, while the multi-screen method allows on-line emittance measurements utilising off-axis screens in combination with fast kicker magnets. The latter is especially the case for high-repetition multi-bunch FELs, such as the European XFEL, which offer the possibility of on-line diagnostics. In this paper, we present comparative measurements of projected and slice emittance applying these two methods at the SwissFEL Injector Test Facility and discuss the implementation of on-line diagnostics at the European XFEL.

Paper

Title

Page

Design of TDS-based Multi-screen Electron Beam Diagnostics for the European XFEL

909

J. Wychowaniak
TUL-DMCS, Łódź, Poland
C. Gerth, M. Yan
DESY, Hamburg, Germany

Dedicated longitudinal electron beam diagnostics is essential for successful operation of modern free-electron lasers. Demand for diagnostic data includes the longitudinal bunch profile, bunch length and slice emittance of the electron bunches. Experimental setups based on transverse deflecting structures (TDS) are excellent candidates for this purpose. At the Free-Electron Laser in Hamburg (FLASH), such a longitudinal bunch profile monitor utilizing a TDS, a fast kicker magnet and an off-axis imaging screen, has been put into operation. It enables the measurement of a single bunch out of a bunch train without affecting the remaining bunches. At the European X-ray Free-Electron Laser (XFEL) multiscreen stations in combination with TDS are planned to be installed. In order to allow for flexible measurements of longitudinal bunch profile and slice emittance, a configurable timing and trigger distribution to the fast kicker magnets and screen stations is required. In this paper, we discuss various operation patterns and the corresponding realization based on MTCA.4 technology.

THP088

Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility

941

M. Yan, B. Beutner, C. Gerth
DESY, Hamburg, Germany
R. Ischebeck, E. Prat
PSI, Villigen PSI, Switzerland

High-brightness electron bunches with small transverse emittance are required to drive X-ray free-electron lasers (FELs). For the measurement of the transverse emittance, the quadrupole scan and multi-screen methods are the two most common procedures. By employing a transverse deflecting structure, the measurement of the slice emittance becomes feasible. The quadrupole scan is more flexible in freely choosing the data points during the scan, while the multi-screen method allows on-line emittance measurements utilising off-axis screens in combination with fast kicker magnets. The latter is especially the case for high-repetition multi-bunch FELs, such as the European XFEL, which offer the possibility of on-line diagnostics. In this paper, we present comparative measurements of projected and slice emittance applying these two methods at the SwissFEL Injector Test Facility and discuss the implementation of on-line diagnostics at the European XFEL.