FEL2014 - List of Authors (Ivanisenko, Ye.)

Paper	Title	Page
THP082	Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF	922
	Ye. Ivanisenko, V. Schlott PSI, Villigen PSI, Switzerland P. Peier DESY, Hamburg, Germany
	Funding: The research leading to these results has received funding from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement n.°290605 (PSI-FELLOW/COFUND) The SwissFEL Injector Test Facility (SITF) is an electron linear accelerator with a single bunch compression stage at Paul Scherrer Institute (PSI) in Switzerland. Electro-optic monitors (EOMs) are available for bunch temporal profile measurements before and after the bunch compressor. The profile reconstruction is based upon spectral decoding technique. This diagnostic method is non-invasive, compact and cost-effective. It does not have high resolution and wide dynamic range of an RF transverse deflecting structure (TDS), but it is free of transverse beam size influence, what makes it a perfect tool for fast compression tuning. We present results of EOM and TDS measurements with down to 150 fs long bunches after the compression stage at SITF.

Paper

Title

Page

Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF

922

Ye. Ivanisenko, V. Schlott
PSI, Villigen PSI, Switzerland
P. Peier
DESY, Hamburg, Germany

Funding: The research leading to these results has received funding from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement n.°290605 (PSI-FELLOW/COFUND)
The SwissFEL Injector Test Facility (SITF) is an electron linear accelerator with a single bunch compression stage at Paul Scherrer Institute (PSI) in Switzerland. Electro-optic monitors (EOMs) are available for bunch temporal profile measurements before and after the bunch compressor. The profile reconstruction is based upon spectral decoding technique. This diagnostic method is non-invasive, compact and cost-effective. It does not have high resolution and wide dynamic range of an RF transverse deflecting structure (TDS), but it is free of transverse beam size influence, what makes it a perfect tool for fast compression tuning. We present results of EOM and TDS measurements with down to 150 fs long bunches after the compression stage at SITF.