Tron, A.M.
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X-RAY STREAK CAMERA OF 10 FS RESOLUTION FOR XFEL |
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A.M. Tronª Lebedev Physical Institute of Russian Academy of Sciences, Moscow, Russia Abstract X-ray streak camera, based on new principle operation, with resolution of 10 fs for the XFEL project is considered. Main its characteristics and construction features are presented and discussed. ª – corresponding author |
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