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RIS citation export for TUPLH09: Thermal Effects on Bragg Diffraction of XFEL Optics

TY  - CONF
AU  - Qu, Z.
AU  - Ma, Y.
AU  - Wu, J.
AU  - Yang, B.
AU  - Zhou, G.
ED  - Yamazaki, Yoshishige
ED  - Raubenheimer, Tor
ED  - McCausey, Amy
ED  - Schaa, Volker RW
TI  - Thermal Effects on Bragg Diffraction of XFEL Optics
J2  - Proc. of NAPAC2019, Lansing, MI, USA, 01-06 September 2019
CY  - Lansing, MI, USA
T2  - North American Particle Accelerator Conference
T3  - 4
LA  - english
AB  - Crystal optical devices are widely used in X-ray free electron laser (XFEL) systems, monochromators, beam splitters, high-reflectance backscattering mirrors, lenses, phase plates, diffraction gratings, and spectrometers. The absorption of X-ray in these optical devices can cause increase of temperature and consequent thermal deformation, which can dynamic change in optic output. In self-seeding XFEL, the thermal deformation and strain in monochromator could cause significant seed quality degradation: central energy shift, band broadening and reduction in seed power. To quantitatively estimate the impact of thermomechanical effects on seed quality, we conduct thermomechanical simulations combined with diffraction to evaluate the seed quality with residual temperature field in a pump-probe manner. With our results, we show that a critical repetition rate could be determined, once the criteria for deviation of the seed quality are selected. This tool shows great potential for the design of XFEL optics for stable operation.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 506
EP  - 508
KW  - FEL
KW  - photon
KW  - optics
KW  - simulation
KW  - synchrotron
DA  - 2019/10
PY  - 2019
SN  - 2673-7000
SN  - 978-3-95450-223-3
DO  - doi:10.18429/JACoW-NAPAC2019-TUPLH09
UR  - http://jacow.org/napac2019/papers/tuplh09.pdf
ER  -