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RIS citation export for TUPLE13: Analytical Thermal Analysis of Thin Diamond in High-Intensity High-Repetition-Rate Application

TY  - CONF
AU  - Hong, Y.
AU  - Wu, J.
AU  - Yang, B.
AU  - Zhou, G.
ED  - Yamazaki, Yoshishige
ED  - Raubenheimer, Tor
ED  - McCausey, Amy
ED  - Schaa, Volker RW
TI  - Analytical Thermal Analysis of Thin Diamond in High-Intensity High-Repetition-Rate Application
J2  - Proc. of NAPAC2019, Lansing, MI, USA, 01-06 September 2019
CY  - Lansing, MI, USA
T2  - North American Particle Accelerator Conference
T3  - 4
LA  - english
AB  - Thin diamond plates are used in monochromator for X-ray Free-Electron Laser self-seeding scheme. To function properly, they must endure high-intensity and high-repetition-rate laser pulses without crossing thresholds set by various adverse effects, such as thermal strain-induced diffraction distortion and graphitization. In this work, a theoretical model is developed, and an analytical solution is derived to elucidate potential thermal runaway under edge cooling condition. It is shown that the crystal edge cooling can effectively mitigate the issue to a certain extent. The analytical solution can be used as an efficient tool for XFEL operation parameter setup.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 587
EP  - 590
KW  - laser
KW  - FEL
KW  - electron
KW  - operation
KW  - free-electron-laser
DA  - 2019/10
PY  - 2019
SN  - 2673-7000
SN  - 978-3-95450-223-3
DO  - doi:10.18429/JACoW-NAPAC2019-TUPLE13
UR  - http://jacow.org/napac2019/papers/tuple13.pdf
ER  -