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@InProceedings{hong:napac2019-tuple13,
author = {Y. Hong and J. Wu and B. Yang and G. Zhou},
title = {{Analytical Thermal Analysis of Thin Diamond in High-Intensity High-Repetition-Rate Application}},
booktitle = {Proc. NAPAC'19},
pages = {587--590},
paper = {TUPLE13},
language = {english},
keywords = {laser, FEL, electron, operation, free-electron-laser},
venue = {Lansing, MI, USA},
series = {North American Particle Accelerator Conference},
number = {4},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {10},
year = {2019},
issn = {2673-7000},
isbn = {978-3-95450-223-3},
doi = {10.18429/JACoW-NAPAC2019-TUPLE13},
url = {http://jacow.org/napac2019/papers/tuple13.pdf},
note = {https://doi.org/10.18429/JACoW-NAPAC2019-TUPLE13},
abstract = {Thin diamond plates are used in monochromator for X-ray Free-Electron Laser self-seeding scheme. To function properly, they must endure high-intensity and high-repetition-rate laser pulses without crossing thresholds set by various adverse effects, such as thermal strain-induced diffraction distortion and graphitization. In this work, a theoretical model is developed, and an analytical solution is derived to elucidate potential thermal runaway under edge cooling condition. It is shown that the crystal edge cooling can effectively mitigate the issue to a certain extent. The analytical solution can be used as an efficient tool for XFEL operation parameter setup.},
}