Title |
Characteristics of Polarized Coherent Radiation in Thz Region From a Crossed-Undulator |
Authors |
- H. Saito, H. Hama, F. Hinode, K. Kanomata, S. Kashiwagi, S. Miura, N.M. Morita, T. Muto, I. Nagasawa, K. Nanbu, S. Ninomiya, K. Takahashi, H. Yamada
Tohoku University, Research Center for Electron Photon Science, Sendai, Japan
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Abstract |
A variable polarized THz light source using a crossed-undulator configuration has been developed at Research Center for Electron Photon Science (ELPH), Tohoku University. It consists of two planar undulators of which deflecting planes cross at right angles and a phase shifter for phase adjustment. Polarization of the crossed-undulator has observation angle dependence due to that of radiation wavelength and optical path length difference between two radiations. That limits an angular range maintaining the identical polarization state. Assuming undulator parameters for our experiment (a fundamental frequency 1.9 THz and a number of periods seven) degree of circular polarization larger than 0.9 can be obtained only in the range of 2.2 mrad, i. e. 13% of the radiation angular spread.
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Paper |
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Conference |
IPAC2019 |
Series |
International Particle Accelerator Conference (10th) |
Location |
Melbourne, Australia |
Date |
19-24 May 2019 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia) |
Online ISBN |
978-3-95450-208-0 |
Received |
15 May 2019 |
Accepted |
23 May 2019 |
Issue Date |
21 June 2019 |
DOI |
doi:10.18429/JACoW-IPAC2019-TUPRB038 |
Pages |
1769-1771 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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