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https://doi.org/10.18429/JACoW-IPAC2019-TUPRB023
Title Considerations for the Ultrahard X-ray Undulator Line of the European XFEL
Authors
  • E. Schneidmiller, V. Balandin, W. Decking, M. Dohlus, N. Golubeva, D. Nölle, M.V. Yurkov, I. Zagorodnov
    DESY, Hamburg, Germany
  • G. Geloni, Y. Li, S. Molodtsov, J. Pflüger, S. Serkez, H. Sinn, T. Tanikawa, S. Tomin
    EuXFEL, Schenefeld, Germany
Abstract The European XFEL is a multi-user X-ray FEL facility based on superconducting linear accelerator. Presently, three undulators (SASE1, SASE2, SASE3) routinely deliver high-brightness soft- and hard- X-ray beams for users. There are two empty undulator tunnels that were originally designed to operate with spontaneous radiators in the range 20-90 keV. We consider, instead a possible installation of two FEL undulators. One of them (SASE4) is proposed for operation in a standard (7-25 keV) range as well as in ultrahard (25-100 keV) regime. We discuss a possible location and length of SASE4, modifications of electron beam transport, beam dynamics, choice of undulator technology, different operation modes (SASE and advanced lasing concepts) etc.
Paper download TUPRB023.PDF [0.346 MB / 4 pages]
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Conference IPAC2019
Series International Particle Accelerator Conference (10th)
Location Melbourne, Australia
Date 19-24 May 2019
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia)
Online ISBN 978-3-95450-208-0
Received 14 May 2019
Accepted 23 May 2019
Issue Date 21 June 2019
DOI doi:10.18429/JACoW-IPAC2019-TUPRB023
Pages 1732-1735
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.