Author: Zhu, Y.
Paper Title Page
MOPML030 Demonstration of a Tunable Electron Beam Chopper for Application in 200 kV stroboscopic TEM 467
 
  • C.-J. Jing, S.V. Baryshev, A. Kanareykin, A. Liu, Y. Zhao
    Euclid TechLabs, LLC, Solon, Ohio, USA
  • J.W. Lau
    NIST, Gaithersburg, Maryland, USA
  • D. Masiel, B. Reed
    Integrated Dynamic Electron Solutions, Pleasanton, California, USA
  • Y. Zhu
    BNL, Upton, Long Island, New York, USA
 
  Funding: The project is supported by the Office of Basic Energy Science of DOE through a Small Business Innovative Research grant #DE-SC0013121.
For the last several decades, time-resolved transmission electron microscopes (TEM) exploring the sub-microsecond timescale have relied on the photoemission technology to generate the single or train of electron bunches. However, the complexity of additional laser system and the availability of high repitition rate laser limit applications of the laser-driven approach. Lately we have made substantial progress towards pioneering a new kind of time-resolved TEM, complementary to the existing laser-based techniques. Using a tunable RF beam-chopper, we are able to retrofit an exsiting TEM providing a pulsed electron beam at a continuously tunable reptition rate up to 12GHz and a tunable bunch length. In the article we will briefly discuss the working principle and experimental progress to date.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-MOPML030  
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