Author: Wu, C.Y.
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WEPAL057 Methods to Detect Error Sources and Their Application at the TPS 2305
 
  • C.H. Huang, Y.-S. Cheng, P.C. Chiu, K.T. Hsu, K.H. Hu, C.Y. Wu
    NSRRC, Hsinchu, Taiwan
 
  For a low-emittance photon light source, beam stability is a very important property to attain a high-quality photon beam. While it is hard to avoid beam perturbations in a storage ring, it is more important to quickly find the source locations and to remove or eliminate the sources as soon as possible. In this report, we develop a method to identify the locations of multiple sources. For a source with a particular frequency, the relative phase between sources can also be obtained. This method has been a useful tool during TPS operation and its methodology and practical applications are described in this report.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-WEPAL057  
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WEPAL058 Beam Loss Studies at the Taiwan Photon Source 2309
 
  • C.H. Huang, J. Chen, Y.-S. Cheng, K.T. Hsu, K.H. Hu, D. Lee, C.Y. Wu
    NSRRC, Hsinchu, Taiwan
 
  PIN-photodiodes and RadFETs are installed in the storage ring of the Taiwan Photon Source (TPS) to study beam loss distributions and mechanisms. In the highest dose area, the radiation comes mainly from hard X-rays produced by synchrotron bending magnets. During beam cleaning and after replacing a vacuum chamber, losses due to inelastic Coulomb scattering occur mostly downstream from bending magnets while elastic scattering causes electrons to get lost mainly after an elliptically polarizing undulator which has a limited vertical aperture. During the injection period, the beam loss pattern can be changed by modifying injection conditions or lattice settings. The beam loss usually happens in the injection section and small-aperture section. The injection efficiency can be improved by minimizing the detected injection loss.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-WEPAL058  
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THPMK012 Reduction of Dynamic Multipole Content in Insertion Devices Using Flat Wires 4313
 
  • T.Y. Chung, S.D. Chen, M.-S. Chiu, S.J. Huang, C.-S. Hwang, J.C. Jan, C.Y. Kuo, Y.T. Li, C.Y. Wu
    NSRRC, Hsinchu, Taiwan
  • C.-S. Hwang
    NCTU, Hsinchu, Taiwan
 
  Multipole errors of an insertion device are generally corrected based on measurements and analysis of the magnetic field integrals. Multipole components in a strong and narrow non-uniform field of an insertion device appear as dynamic multipoles. Flat wires were installed and commissioned to determine if the dynamic multipoles can be eliminated in an APPLE-II type undulator. In this work, we will discuss and compare the reduction of the dynamic multipole content and it's beam dynamics effects with the flat wire through an analysis of field calculations and beam-based measurements in the storage ring.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-THPMK012  
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