| Paper |
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| THPML065 |
Preliminary Results of the Bunch Arrival-Time Monitor at SXFEL |
4787 |
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- J.G. Wang, B. Liu
SINAP, Shanghai, People's Republic of China
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Based on an electro-optical intensity modulation detection scheme, a Bunch Arrival-time Monitor (BAM) is under study at Shanghai soft X-ray Free Electron Laser (SXFEL) to meet the high-resolution requirements of the measurement of bunch arrival time. The first BAM is installed and is being tested at the SXFEL upstream of the first short undulator (modulator) near the seed laser injection point. In this paper, we present the basic working principle, the design of the BAM system and report the preliminary test results.
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| DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IPAC2018-THPML065
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