IPAC2018 - List of Authors (Lanzavecchia, L.)

Paper	Title	Page
WEPAF025	Fast Intensity Monitor Based on Channeltron Electron Multiplier	1873
	G.M.A. Calvi, V. Lante, L. Lanzavecchia, G. Magro, A. Parravicini, E. Rojatti, C. Viviani CNAO Foundation, Milan, Italy
	The paper concerns the Fast Intensity Monitor (FIM) designed for the CNAO (Centro Nazionale di Adroterapia Oncologica), the Italian facility of Oncological Hadrontherapy. The FIM detector has been designed with the purpose of having a continuous and non-destructive measurement of the beam intensity in the High Energy Beam Transfer (HEBT) line. The passage of the beam through a thin aluminum foil produces secondary electrons whose yield depends on beam species (protons or carbon ions), intensity and energy. Secondary electrons are focused on the Channeltron Electron Multiplier (CEM) input, multiplied and sensed over a precision resistor. In order to minimize the perturbation to the beam, the foil is grounded and the read out electronics is floating. This makes electronics design harder but it is a key point to make FIM use possible continuously even during patients treatment. Measurements performed with the FIM are discussed and checked against reference detectors.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-WEPAF025
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Paper

Title

Page

Fast Intensity Monitor Based on Channeltron Electron Multiplier

1873

G.M.A. Calvi, V. Lante, L. Lanzavecchia, G. Magro, A. Parravicini, E. Rojatti, C. Viviani
CNAO Foundation, Milan, Italy

The paper concerns the Fast Intensity Monitor (FIM) designed for the CNAO (Centro Nazionale di Adroterapia Oncologica), the Italian facility of Oncological Hadrontherapy. The FIM detector has been designed with the purpose of having a continuous and non-destructive measurement of the beam intensity in the High Energy Beam Transfer (HEBT) line. The passage of the beam through a thin aluminum foil produces secondary electrons whose yield depends on beam species (protons or carbon ions), intensity and energy. Secondary electrons are focused on the Channeltron Electron Multiplier (CEM) input, multiplied and sensed over a precision resistor. In order to minimize the perturbation to the beam, the foil is grounded and the read out electronics is floating. This makes electronics design harder but it is a key point to make FIM use possible continuously even during patients treatment. Measurements performed with the FIM are discussed and checked against reference detectors.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-WEPAF025

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)