Author: Gurran, L.
Paper Title Page
THPAL086 Superconducting Thin Film RF Measurements 3856
 
  • P. Goudket, L. Bizel-Bizellot, L. Gurran, O.B. Malyshev, S.M. Pattalwar, R. Valizadeh
    STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
  • G. Burt, L. Gurran
    Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
  • P. Goudket, T. Junginger, O.B. Malyshev, S.M. Pattalwar, R. Valizadeh
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • L. Gurran, T. Junginger
    Lancaster University, Lancaster, United Kingdom
  
  As part of an ongoing programme of SRF Thin Films development, a radiofrequency (RF) cavity and cryostat dedicated to the measurement of superconducting coatings at GHz frequencies was designed to evaluate surface resistive losses on a flat sample. The resonator has now been used for measurements on Thin Film samples. Results from a test on a sample previously tested at Cornell University are presented. In order to simplify the measurements and achieve a faster turnaround, the experiment will be moved to a new cryostat fitted with a cryocooler. This will limit the measurements to low power only, but will allow a much faster sorting of samples to identify those that would benefit from further investigation. A description of the system and initial results will be presented.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-THPAL086  
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