Author: Feng, J.
Paper Title Page
THPAK116 Modeling Surface Roughness Effects and Emission Properties of Bulk and Layered Metallic Photocathode 3515
 
  • D.A. Dimitrov, G.I. Bell
    Tech-X, Boulder, Colorado, USA
  • I. Ben-Zvi, J. Smedley
    BNL, Upton, Long Island, New York, USA
  • J. Feng, S.S. Karkare, H.A. Padmore
    LBNL, Berkeley, California, USA
 
  Funding: This work was supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract Nos. DE-SC0013190, DE-AC02-05CH11231, and KC0407-ALSJNT-I0013.
The thermal limit of the intrinsic emittance of photocathodes represents an important property to measure experimentally and to understand theoretically. Detailed measurements of intrinsic emittance have become possible in momentatron experiments. Moreover, recent developments in material design have allowed growing photoemissive layers with controlled surface roughness. Although analytical formulations of the effects of roughness have been developed, a full theoretical model and experimental verification are lacking. We aim to bridge this gap by developing realistic models for different materials in the three-dimensional VSim particle-in-cell code. We have recently implemented modeling of electron photo-excitation, transport, and emission from photoemissive layers grown on a substrate. We report results from simulations with these models on electron emission from antimony and gold. We consider effects due to density of states, photoemissive layer thickness, surface roughness and how they affect the spectral response of quantum yield and intrinsic emittance.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2018-THPAK116  
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