Author: Yan, J.
Paper Title Page
MOPHA164 Wire Scanner for High Intensity Beam Profile Diagnostics 622
 
  • J. Yan, J. Gubeli, K. Jordan
    JLab, Newport News, Virginia, USA
  • B. Bailey
    University of Tennessee, Knoxville, USA
 
  A control and data acquisition system of a high speed wire scanner is developed for high intensity beam profile diagnostics. The control system of the wire scanner includes two IOCs, a Soft IOC and a VME IOC. The Soft IOC connects with an Aerotech Ensemble motor drive through EPCIS motor record and controls the movement of the wire scanner. An Electrical Input card samples the real-time position of the wire through an incremental encoder, and generates a pulse to synchronize a VME ADC data acquisition card, which digitizes and samples the beam-induced signal after pre-amplification. A VME Relay Output card is installed to control the Brake Solenoid and Actuator Solenoid. All the VME I/O cards are installed on one VME crate and controlled by the VME IOC. The system configuration and software of the wire scanner are under development.
Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
 
poster icon Poster MOPHA164 [0.973 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-ICALEPCS2019-MOPHA164  
About • paper received ※ 30 September 2019       paper accepted ※ 10 October 2019       issue date ※ 30 August 2020  
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