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@InProceedings{gessler:icalepcs2019-thapp05,
author = {P. Gessler and H. Ali and F. Babies and K.-E. Ballak and H. Bamaga and B. Baranasic and O. Bieler and N. Coppola and K. Dornack and J. Eilers and D. Emes and B. Fernandes and M. Fobian and T. Freyermuth and S.T. Huynh and N. Jardón Bueno and M. Meyer and O. Oshtuk and P. Parlicki and J. Reifschläger and S. Sayar and H. Sotoudi Namin and M. Stupar and J. Tolkiehn and H. Vega Perez and S. Wagner and J. Zach},
% author = {P. Gessler and H. Ali and F. Babies and K.-E. Ballak and H. Bamaga and B. Baranasic and others},
% author = {P. Gessler and others},
title = {{Overview of Acquisition and Control Electronics and Concepts for Experiments and Beam Transport at the European XFEL}},
booktitle = {Proc. ICALEPCS'19},
pages = {1554--1560},
paper = {THAPP05},
language = {english},
keywords = {PLC, controls, interface, FEL, electron},
venue = {New York, NY, USA},
series = {International Conference on Accelerator and Large Experimental Physics Control Systems},
number = {17},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {08},
year = {2020},
issn = {2226-0358},
isbn = {978-3-95450-209-7},
doi = {10.18429/JACoW-ICALEPCS2019-THAPP05},
url = {https://jacow.org/icalepcs2019/papers/thapp05.pdf},
note = {https://doi.org/10.18429/JACoW-ICALEPCS2019-THAPP05},
abstract = {FPGA based fast electronics to acquire and pre-process signals of detectors and diagnostics and PLC based hardware and software for motion, vacuum and other control and monitoring applications are key elements of the European X-Ray Free Electron Laser. In order to bring the newly developed scientific user facility up and running, the underlying electrical and electronic components require a diverse array of tools and processes to be developed in order to meet the continually adapting requirements and make use of technological advances. Many challenges were faced, including high availability and up-time, adaptability to a dynamic environment, rapid lead-time for integration of complex components, numerous instrumentation installations and commissioning, high time resolution and subsequently, high demands on data and sampling rates, synchronization and real-time processing. In this contribution we will provide an overview of the selected technologies, developed concepts and solutions along with generically designed frameworks and tools, which aim to provide a high degree of standardization on the control systems and even automatic generation from requirements to final install.},
}