ORNL, Oak Ridge, Tennessee, USA
A technique to reduce point-spread originating from physical slit width in emittance measurements is described. This technique is developed to improve phase resolution in a longitudinal emittance apparatus consisting of a dipole magnet, energy-selecting slit and bunch shape monitor. In this apparatus, the energy and phase resolutions are directly proportional to the width of the slit, but the virtual slit method enables sub-slit resolution. The bunch phase profile is measured at two points in the energy distribution with a separation less than the physical slit width. The difference of these two profiles is used to reconstruct the profile from a virtual slit of width equal to the separation.
