Author: Kovalchuk, O.S.
Paper Title Page
THAO06 Features of the Metal Microstrip Detectors for Beam Profile Monitoring 211
 
  • V.M. Pugatch, O.S. Kovalchuk, D. Ramazanov
    NASU/INR, Kiev, Ukraine
 
  Funding: National academy of sciences, Ukraine
Features of Metal Microstrip Detectors (MMD) are presented for application in beam profile monitoring of charged particles and synchrotron radiation beams. Through an innovative plasma-chemistry etching production process*, thin metal micro-strips only 1-2μm thick are aligned. Because of the very thin nature of the strips, the MMD is nearly transparent, and can be used in-situ for measuring, tuning and imaging the beam online. Metal structure of sensors guaranties high radiation tolerance (about 100MGy) providing their stable response to the beam particles (by the secondary electron emission) independent upon the accumulated fluence. The spatial resolution of the MMD is determined by the strips pitch constituting from 5 to 100µm in currently manufactured samples*. The data were obtained with MMDs read out by the low noise X-DAS system** providing integration time from 1 to 500ms, and the ability to process signals in real time. The scope of MMD & X-DAS is scientific and applied research using beams: in control systems of accelerators and synchrotron radiation sources. New possibilities are discussed for equipment requiring high spatial resolution and radiation hardness.
* V.M. Pugatch et al. Plasma technologies for manufacturing micro-strip metal detectors for ionizing radiation. Series «Plasma Physics» (13). 2007, № 1, p. 173-175.
** sens-tech.com
 
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DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2020-THAO06  
About • paper received ※ 04 September 2020       paper accepted ※ 27 October 2020       issue date ※ 30 October 2020  
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