Author: Ko, I.S.
Paper Title Page
TUPP27
Monitor for Microbunching Instability in X-ray Free Electron Laser  
 
  • C. Kim, H.-S. Kang, G. Kim, I.S. Ko, J.H. Ko
    PAL, Pohang, Republic of Korea
 
  The microbunching instability is an important issue in an X-ray Free Electron Laser (XFEL) because the intensity of the FEL can be reduced significantly when the microbunching instability is generated. In the X-ray Free Electron Laser of the Pohang Accelerator Laboratory (PAL-XFEL), a visible CCD camera was installed in the existing coherent radiation monitor (CRM) for the bunch length monitoring. The measurement result shows that the CCD camera can be used as a direct monitor to diagnose the microbunching instability and can be used to optimize the FEL lasing in the PAL-XFEL.  
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