Author: He, J.
Paper Title Page
TUPP01
Bunch Purity Measurement and Improvement  
 
  • J. He, J.H. Yue
    IHEP, People’s Republic of China
 
  A signal electron level purity is mandatory for a nuclear resonant scattering experiment. For the establishing such kind of beamlines on High Energy Photon Source (HEPS), a new time-correlated single photon counting system has been implemented on the storage ring of Beijing Electron-Positron Collider II (BEPCII), which is used to monitor the purity. The system could track the purity deterioration process. The possible reason of impurity growth is analysed, the measurement results confirmed that Touschek scattering and pre-accelerators of the storage ring are the main mechanisms of impurity growth. A bunch cleaning technique based on a sinusoidal signal mixed a pseudo-square wave has been verified which could improve the purity to the level of 10-7. This paper mainly describes the experiment details and measurement results of purity measurement and improvement.  
poster icon Poster TUPP01 [1.100 MB]  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)  
 
THPP31
Consideration and Design of HEPS Beam Instrumentation  
 
  • J.H. Yue, J.S. Cao, Y.Y. Du, J. He, F. Liu, Z. Liu, Y.H. Lu, H.Z. Ma, Y.F. Sui, L. Wang, S.J. Wei, T.G. Xu, J. Yang, Q. Ye, D. Yin, L. Yu, X.E. Zhang, J.X. Zhao, X.Y. Zhao, Y. Zhao, D.C. Zhu
    IHEP, Beijing, People’s Republic of China
 
  High Energy Synchrotron Photon Source(HEPS)is an ultra-low emittance light source, of which the energy is 6 GeV, the current is 100-200mA, so it is more difficult to the physics design and hardware design. To the beam instrumentation, sub-micron level beam position measurement and controlling system, sub-micron synchrotron measurement system based x-ray and bunch by bunch feedback system are the technologies which we need to master and to develop. Beam position measurement system is based on digital technology; it is difficult to design and home-made. Emittance measurement of storage is relied on the accuracy measurement of beam profile, of which the resolution is sub-micron level; x ray KB mirror imaging system can meet such high resolution requirement and a good choice. bunch by bunch feedback systems are used to restrin the beam instabilities. In this article, the author introduces the beam instrumentations in detail.  
poster icon Poster THPP31 [1.863 MB]  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)