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@unpublished{ma:ibic2020-wepp35,
author = {S. Ma and A. Arnold and P.E. Evtushenko and A.A. Ryzhov and J. Schaber and J. Teichert and R. Xiang},
% author = {S. Ma and A. Arnold and P.E. Evtushenko and A.A. Ryzhov and J. Schaber and J. Teichert and others},
% author = {S. Ma and others},
title = {{Simulation and Experiments of Transverse Emittance Measurements with Slit scan and Quadrupole scan at ELBE SRF Gun}},
booktitle = {Proc. IBIC'20},
language = {english},
intype = {presented at the},
series = {International Beam Instrumentation Conference},
number = {9},
venue = {Santos, Brazil},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {oct},
year = {2020},
note = {presented at IBIC2020 in Santos, Brazil, unpublished},
abstract = {Emittance is one of the most important parameters for electron injectors and accelerator facilities. Two traditional methods, the single slit-scan, and quadrupole scan are used in most emittance measurements. Although the experiment condition is the same, one may receive different emittance results. The difference between simulation and experiment in the beamline will be discussed in this paper. As a statistical sampling, the error of the slit-scan system is related to bunch transverse distribution, bunch charge, slit width and thickness, beamlet number, drift distance, and screen resolution. In suitable conditions, the space-charge dominated beam will become emittance dominated beam after slits and emittances from slit-scan are reliable. The error quadrupole scan depends on the quadrupole field’s measurement accuracy and bunch distribution. In this paper, we use a simple way to calibrate quadrupole focus strength. Space charge usually can’t be avoided and will lead to some errors for quadrupole scan.},
}