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TY - CONF AU - Friend, M.L. AU - Cao, S.V. AU - Hartz, M. AU - Koshio, Y. AU - Nakamura, A. AU - Nakayoshi, K. AU - Sakashita, K. ED - Tavares, Daniel ED - Picoreti, Renan ED - Bruno, Gustavo ED - Marques, Sergio ED - Schaa, Volker R.W. TI - First Beam Profile Measurements by Beam Induced Fluorescence at the J-PARC Neutrino Extraction Beamline J2 - Proc. of IBIC2020, Santos, Brazil, 14-18 September 2020 CY - Santos, Brazil T2 - International Beam Instrumentation Conference T3 - 9 LA - english AB - A Beam Induced Fluorescence (BIF) profile monitor is under development at the J-PARC neutrino extraction beamline, where neutrinos are produced using 30 GeV protons from the J-PARC MR accelerator. Towards the goal of continuously and non-destructively measuring the 1.3MW proton beam profile spill-by-spill using fluorescence from proton interactions with injected gas, a full working prototype monitor was installed in the beamline in 2019. The prototype includes a scheme for pulsed injection of N₂ gas into the ultra-high vacuum beampipe and two optical readout arms, a conventional one using an Image Intensifier coupled to a CID camera, along with an array of optical fibers coupled to a Multi-Pixel Photon Counter array. Initial beam tests of the system were carried out in early 2020, and BIF light was successfully observed in both optical systems. Details of the prototype monitor, along with first proton beam profile measurement results, will be shown. Improvement plans towards continuous operation of the new profile monitor will also be discussed. PB - JACoW Publishing CP - Geneva, Switzerland SP - 184 EP - 187 KW - injection KW - proton KW - background KW - photon KW - extraction DA - 2020/10 PY - 2020 SN - 2673-5350 SN - 978-3-95450-222-6 DO - doi:10.18429/JACoW-IBIC2020-WEPP34 UR - https://www.jacow.org/ibic2020/papers/wepp34.pdf ER -