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TY - CONF AU - Maesaka, H. AU - Dewa, H. AU - Fujita, T. AU - Fukui, T. AU - Masaki, M. AU - Takano, S. AU - Ueshima, K. ED - Tavares, Daniel ED - Picoreti, Renan ED - Bruno, Gustavo ED - Marques, Sergio ED - Schaa, Volker R.W. TI - Design of the Beam Diagnostic System for the New 3 GeV Light Source in Japan J2 - Proc. of IBIC2020, Santos, Brazil, 14-18 September 2020 CY - Santos, Brazil T2 - International Beam Instrumentation Conference T3 - 9 LA - english AB - We present a design overview of the beam diagnostic system for the new 3 GeV light source being constructed in Tohoku, Japan, and some test results obtained at SPring-8. This light source will generate brilliant x-rays from a high-quality electron beam having 1 nm rad emittance and 400 mA maximum stored current. To achieve the design performance and stability, we must monitor various beam parameters precisely. The beam position should be detected precisely: single-pass resolution < 0.1 mm (0.1 nC injected beam), COD resolution < 0.1 μm (more than 100 mA stored current), position stability < 5 μm for 1 month. We will use 112 button-type BPMs in the storage ring for these purposes. The stored beam current and beam size are also monitored with a DCCT and an x-ray pinhole camera. We will install a 3-pole wiggler to a straight section for the pinhole camera and other optical diagnostics. A stripline BPM and a stripline kicker will be installed to another straight section to suppress the beam instability and to measure betatron tune. We will use FPGA-based high-speed electronics for instability suppression with a bunch-by-bunch feedback method and real-time tune monitoring. PB - JACoW Publishing CP - Geneva, Switzerland SP - 174 EP - 178 KW - diagnostics KW - electron KW - beam-diagnostic KW - storage-ring KW - betatron DA - 2020/10 PY - 2020 SN - 2673-5350 SN - 978-3-95450-222-6 DO - doi:10.18429/JACoW-IBIC2020-WEPP31 UR - https://www.jacow.org/ibic2020/papers/wepp31.pdf ER -