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@InProceedings{donegani:ibic2020-wepp10,
author = {E.M. Donegani},
title = {{Proton-Induced SEY From Beam Interceptive Devices in the ESS Linac}},
booktitle = {Proc. IBIC'20},
pages = {117--119},
paper = {WEPP10},
language = {english},
keywords = {proton, linac, target, electron, instrumentation},
venue = {Santos, Brazil},
series = {International Beam Instrumentation Conference},
number = {9},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {10},
year = {2020},
issn = {2673-5350},
isbn = {978-3-95450-222-6},
doi = {10.18429/JACoW-IBIC2020-WEPP10},
url = {https://www.jacow.org/ibic2020/papers/wepp10.pdf},
note = {https://doi.org/10.18429/JACoW-IBIC2020-WEPP10},
abstract = {During the ESS linac commissioning, a wealth of beam-interceptive devices will be exposed to protons with nominal and non-nominal energies spanning from 75 keV to 2 GeV. Therefore, a database of proton-induced Secondary Emission Yield (SEY) values was prepared for the structural materials of insertable devices into the ESS linac. The database relies on calculations of stopping powers in MCNPX and the Sternglass theory applied to protons in the [1 keV, 2 GeV] energy range. Results are reported for 16 relevant materials to wire scanners, bunch shape monitors and target imaging systems, including: TZM, Ni, SiC and graphite of various densities. In the future, the results can be used also for determining the impact of secondaries on emittance or beam-current measurements with Emittance Monitor Units or Faraday cups of the ESS linac, respectively. Moreover, the database can be extended to critical structural materials of the ESS linac itself, in order to estimate the impact of secondary electrons on the overall beam quality.},
}