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@InProceedings{wootton:ibic2020-tupp10,
author = {K.P. Wootton and H. Cease and M. Erdmann and S.M. Oprondek and M. Ramanathan and B.X. Yang},
title = {{X-Ray Beam Position Monitor Silicon Photodiode Measurements for the Advanced Photon Source Upgrade}},
booktitle = {Proc. IBIC'20},
pages = {46--50},
paper = {TUPP10},
language = {english},
keywords = {photon, instrumentation, power-supply, insertion, insertion-device},
venue = {Santos, Brazil},
series = {International Beam Instrumentation Conference},
number = {9},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {10},
year = {2020},
issn = {2673-5350},
isbn = {978-3-95450-222-6},
doi = {10.18429/JACoW-IBIC2020-TUPP10},
url = {https://www.jacow.org/ibic2020/papers/tupp10.pdf},
note = {https://doi.org/10.18429/JACoW-IBIC2020-TUPP10},
abstract = {To best leverage the orders of magnitude average brightness increase of multi-bend achromat synchrotron radiation storage rings, ambitious beam stability requirements are imposed. One system that will be employed at the Advanced Photon Source Upgrade in support of photon beam stability will be X-ray beam position monitors. In the present work, electrical characterisation of several types of photodiodes are evaluated for potential use in X-ray beam position monitors.},
}