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BiBTeX citation export for THPP34: Calibration and Image Restoration for the Beam Profile Measurement System

@InProceedings{hu:ibic2020-thpp34,
  author       = {L.X. Hu and K.Z. Ding and Y. Song and Y.C. Wu},
  title        = {{Calibration and Image Restoration for the Beam Profile Measurement System}},
  booktitle    = {Proc. IBIC'20},
  pages        = {276--280},
  paper        = {THPP34},
  language     = {english},
  keywords     = {detector, diagnostics, experiment, brightness, background},
  venue        = {Santos, Brazil},
  series       = {International Beam Instrumentation Conference},
  number       = {9},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {10},
  year         = {2020},
  issn         = {2673-5350},
  isbn         = {978-3-95450-222-6},
  doi          = {10.18429/JACoW-IBIC2020-THPP34},
  url          = {https://www.jacow.org/ibic2020/papers/thpp34.pdf},
  note         = {https://doi.org/10.18429/JACoW-IBIC2020-THPP34},
  abstract     = {The beam profile parameters are one of the important parameters which represent the beam quality. And the transverse beam profile parameters are closely related to the beam tuning and optimization of the cyclotron. Machine Vision is a branch of computer science that has really grown over the last 20 years. In order to improve the precision and efficiency of beam profile measurement, machine vision techniques have been developed for the analysis and processing of the beam profile images. A new calibration method has been designed for the calibration of the imaging system. Moreover, a new image noise reduction algorithm has been developed to improve the image quality, and then to improve the accuracy of the beam profile parameters measurement. And image restoration algorithm has also been adopted to eliminate the effects of defocusing blur. The experiment results show that the calibration of the imaging system enables the system can provide quantitative information for beam diagnosis. The image noise reduction and restoration algorithm greatly improve the accuracy of beam profile parameters measurement.},
}