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@unpublished{samadi:ibic2020-thao03,
author = {N. Samadi and L.D. Chapman and L.O. Dallin and X. Shi},
title = {{Source Size and Emittance Measurements for Low-Emittance Light Sources}},
booktitle = {Proc. IBIC'20},
language = {english},
intype = {presented at the},
series = {International Beam Instrumentation Conference},
number = {9},
venue = {Santos, Brazil},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {oct},
year = {2020},
note = {presented at IBIC2020 in Santos, Brazil, unpublished},
abstract = {Radiation-based techniques for measuring electron source sizes are widely used as emittance diagnostics at existing synchrotron sources. In this presentation, we review different radiation-based methods which are being considered as source diagnostics for low emittance synchrotron storage rings. Three of these systems - pinhole imaging, double-slit interferometry, and a K-edge filter-based beam position and size monitor (ps-BPM) system - are studied in detail and optimized for small source size measurements. Each method has its advantages and limitations and provides complementary information. Pinhole imaging is the most commonly used technique which has the simplest setup but with limited resolution. Double-slit interferometry gives the highest sensitivity among the three methods. The ps-BPM system has reasonable resolution in measuring source size and divergence, and at the same time, provides real-time information on source position and angle. A combination of multiple techniques is recommended for the full characterization of the source.},
}