IBIC2019 - List of Authors (Tudor, M.)

Paper	Title	Page
TUPP014	New Combined Function Wire Scanner-Screen Station for the High Resolution Transverse Profile Measurements at FERMI	322
	M. Veronese, A. Abrami, M. Bossi, M. Ferianis, S. Grulja, G. Penco, M. Tudor Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
	We present the upgrade of the transverse profile diagnostics at the end of the FERMI Linac with a new high resolution instrumentation with the aim of improving the accuracy of the measurement of the twiss parameters and of the emittance. A scintillating screen, has been adopted instead of OTR screen due to known COTR issues. We used the same COTR suppression geometry that we had already implemented on our intra undulator screens and YAG:Ce as scintillating material. Screen based transverse profile diagnostics provide single shot measurements with a typical resolution of the order of tens of microns mainly due to refraction effects, geometry and other physical material properties. To extend the resolution to the micron level needed in case of low charge operation, we have equipped the same vacuum chamber with a wire scanner housing 10 micron tungsten wires. This paper describes the design and the first operational experience with the new device and discusses advantages as well as limitations.
	Poster TUPP014 [0.638 MB]
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUPP014
About •	paper received ※ 04 September 2019 paper accepted ※ 09 September 2019 issue date ※ 10 November 2019
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

New Combined Function Wire Scanner-Screen Station for the High Resolution Transverse Profile Measurements at FERMI

322

M. Veronese, A. Abrami, M. Bossi, M. Ferianis, S. Grulja, G. Penco, M. Tudor
Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy

We present the upgrade of the transverse profile diagnostics at the end of the FERMI Linac with a new high resolution instrumentation with the aim of improving the accuracy of the measurement of the twiss parameters and of the emittance. A scintillating screen, has been adopted instead of OTR screen due to known COTR issues. We used the same COTR suppression geometry that we had already implemented on our intra undulator screens and YAG:Ce as scintillating material. Screen based transverse profile diagnostics provide single shot measurements with a typical resolution of the order of tens of microns mainly due to refraction effects, geometry and other physical material properties. To extend the resolution to the micron level needed in case of low charge operation, we have equipped the same vacuum chamber with a wire scanner housing 10 micron tungsten wires. This paper describes the design and the first operational experience with the new device and discusses advantages as well as limitations.

Poster TUPP014 [0.638 MB]

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2019-TUPP014

About •

paper received ※ 04 September 2019 paper accepted ※ 09 September 2019 issue date ※ 10 November 2019

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)