Measuring the Beam Profile by Counting Ionization Electrons

Sandberg, Hampus; Bertsche, William; Bodart, Dominique; Dehning, Bernd; Gibson, Stephen; Levasseur, Swann; Satou, Kenichirou; Schneider, Gerhard; Storey, James; Veness, Raymond

doi:10.18429/JACoW-IBIC2019-TUBO04

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Text/Word citation export for TUBO04: Measuring the Beam Profile by Counting Ionization Electrons

H.S. Sandberg et al., “Measuring the Beam Profile by Counting Ionization Electrons”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 257-260. doi:10.18429/JACoW-IBIC2019-TUBO04