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TY - CONF AU - Gao, B. AU - Chen, F.Z. AU - Leng, Y.B. AU - Zhou, Y.M. ED - Schaa, Volker RW ED - Jansson, Andreas ED - Shea, Thomas ED - Olander, Johan TI - Online Touschek Beam Lifetime Measurement Based on the Precise Bunch-By-Bunch Beam Charge Monitor J2 - Proc. of IBIC2019, Malmö, Sweden, 08-12 September 2019 CY - Malmö, Sweden T2 - International Beam Instrumentation Conferenc T3 - 8 LA - english AB - Beam current and lifetime are the most important parameters to characterize the beam and machine quality of an electron storage ring. In order to describe the behavior of all electron bunches completely and accurately, a precisely bunch-by-bunch charge monitor has been developed at SSRF. Method called two-point equilibrium sampling is introduced to avoid the influence of longitudinal oscillation on the sampling point, thanks to this, the resolution of the BCM was below 0.2 pC. Utilizing the advantages of BCM’s high refresh rate and high resolution, the system can meet the requirement of monitor the bunch-by-bunch beam lifetime, measure touschek lifetime and vacuum lifetime. In this paper, experiments and and analysis will be described in detail. PB - JACoW Publishing CP - Geneva, Switzerland SP - 36 EP - 40 KW - SRF KW - storage-ring KW - injection KW - electron KW - software DA - 2019/11 PY - 2019 SN - 2673-5350 SN - 978-3-95450-204-2 DO - doi:10.18429/JACoW-IBIC2019-MOCO01 UR - http://jacow.org/ibic2019/papers/moco01.pdf ER -