| Title |
Performance Studies of Industrial CCD Cameras Based on Signal-To-Noise and Photon Transfer Measurements |
| Authors |
- G. Kube
DESY, Hamburg, Germany
|
| Abstract |
Taking advantage of the rapid development and the huge market for commercial available optical sensors, in the past years optical measuring techniques took on greater significance. Nowadays, area scan CCD or CMOS sensors are widely used for beam profile diagnostics. They provide the full two-dimensional information about the particle beam distribution, allowing in principle to investigate shot-to-shot profile fluctuations at moderate repetition rates. In order to study the performance and to characterize these cameras, photon transfer is a widely applied popular and valuable testing methodology. In this contribution, studies based on signal-to-noise and photon transfer measurements are presented for CCD cameras which are in use for beam profile diagnostics at different DESY accelerators.
|
| Paper |
download TUPG76.PDF [0.388 MB / 4 pages] |
| Conference |
IBIC2016, Barcelona, Spain |
| Series |
International Beam Instrumentation Conference (5th) |
| Proceedings |
Link to full IBIC2016 Proccedings |
| Session |
Tuesday Poster Session |
| Date |
13-Sep-16 16:00–18:00 |
| Main Classification |
Transverse Profile Monitors |
| Keywords |
photon, electron, diagnostics, detector, background |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Isidre Costa (ALBA-CELLS, Barcelona, Spain); Ubaldo Iriso (ALBA-CELLS, Barcelona, Spain); Francis Pérez (ALBA-CELLS, Barcelona, Spain); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-177-9 |
| Published |
February 2017 |
| Copyright |
|
