Title |
Transverse Deflecting Structure Dynamics for Time-Resolved Machine Studies of Shine |
Authors |
- J.W. Yan, H.X. Deng, B. Liu, D. Wang
SINAP, Shanghai, People’s Republic of China
- H.X. Deng, B. Liu, D. Wang
SARI-CAS, Pudong, Shanghai, People’s Republic of China
|
Abstract |
The transverse deflecting structure (TDS) has been widely used in modern free electron laser facilities for the longitudinal phase space diagnostics of electron beams. As the first hard x-ray free electron laser in China, the SHINE is designed to deliver photons with a repetition rate up to 1 MHz. In this paper, we present the beam dynamics study of the X-band TDS behind the undulator of SHINE. In order to prevent the screen from being damaged by electron bunches with a high repetition rate, the phase of the transverse deflecting cavity is designed to deviate from zero, and only those electron bunches that are kicked by the transverse deflecting cavity are sent to the screen. In addition, the evolutionary algorithm is introduced to optimize the lattice of the TDS line to reach the highest possible resolution.
|
Funding |
National Natural Science Foundation of China (11775293), the National Key Research and Development Program of China (2016YFA0401900) and Ten Thousand Talent Program. |
Paper |
download THP018.PDF [1.140 MB / 3 pages] |
Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
Conference |
FEL2019 |
Series |
Free Electron Laser Conference (39th) |
Location |
Hamburg, Germany |
Date |
26-30 August 2019 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Volker R.W. Schaa (GSI, Darmstadt, Germany); Winfried Decking (DESY, Hamburg, Germany); Harald Sinn (EuXFEL, Schenefeld, Germany); Gianluca Geloni (EuXFEL, Schenefeld, Germany); Siegfried Schreiber (DESY, Hamburg, Germany); Michaela Marx (DESY, Hamburg, Germany) |
Online ISBN |
978-3-95450-210-3 |
Online ISSN |
"" |
Received |
19 August 2019 |
Accepted |
28 August 2019 |
Issue Date |
05 November 2019 |
DOI |
doi:10.18429/JACoW-FEL2019-THP018 |
Pages |
632-634 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
|